Xiang Liu, Hehe Hu, Ce Ning, Guangliang Shang, Wei Yang, Ke Wang, Xinhong Lu, Woobong Lee, Gang Wang, Jianshe Xue, Jung mok Jun, Shengdong Zhang. Investigation into sand mura effects of a-IGZO TFT LCDs. Microelectronics Reliability, 63:148-151, 2016. [doi]
@article{LiuHNSYWLLWXJZ16,
title = {Investigation into sand mura effects of a-IGZO TFT LCDs},
author = {Xiang Liu and Hehe Hu and Ce Ning and Guangliang Shang and Wei Yang and Ke Wang and Xinhong Lu and Woobong Lee and Gang Wang and Jianshe Xue and Jung mok Jun and Shengdong Zhang},
year = {2016},
doi = {10.1016/j.microrel.2016.06.009},
url = {http://dx.doi.org/10.1016/j.microrel.2016.06.009},
researchr = {https://researchr.org/publication/LiuHNSYWLLWXJZ16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {63},
pages = {148-151},
}