Chunsheng Liu, Vikram Iyengar. Test scheduling with thermal optimization for network-on-chip systems using variable-rate on-chip clocking. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 652-657, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
@inproceedings{LiuI06:0,
title = {Test scheduling with thermal optimization for network-on-chip systems using variable-rate on-chip clocking},
author = {Chunsheng Liu and Vikram Iyengar},
year = {2006},
doi = {10.1145/1131666},
url = {http://doi.acm.org/10.1145/1131666},
tags = {optimization, testing},
researchr = {https://researchr.org/publication/LiuI06%3A0},
cites = {0},
citedby = {0},
pages = {652-657},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006},
editor = {Georges G. E. Gielen},
publisher = {European Design and Automation Association, Leuven, Belgium},
isbn = {3-9810801-0-6},
}