Chunsheng Liu, Vikram Iyengar. Test scheduling with thermal optimization for network-on-chip systems using variable-rate on-chip clocking. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 652-657, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
@inproceedings{LiuI06:0, title = {Test scheduling with thermal optimization for network-on-chip systems using variable-rate on-chip clocking}, author = {Chunsheng Liu and Vikram Iyengar}, year = {2006}, doi = {10.1145/1131666}, url = {http://doi.acm.org/10.1145/1131666}, tags = {optimization, testing}, researchr = {https://researchr.org/publication/LiuI06%3A0}, cites = {0}, citedby = {0}, pages = {652-657}, booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006}, editor = {Georges G. E. Gielen}, publisher = {European Design and Automation Association, Leuven, Belgium}, isbn = {3-9810801-0-6}, }