Wald Test for Adaptive Array Detection With General Configuration

Jun Liu 0004, Weijian Liu, Xun Chen 0001, Danilo Orlando, Alfonso Farina. Wald Test for Adaptive Array Detection With General Configuration. IEEE Trans. Aerospace and Electronic Systems, 58(5):4423-4433, 2022. [doi]

Authors

Jun Liu 0004

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Weijian Liu

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Xun Chen 0001

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Danilo Orlando

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Alfonso Farina

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