A novel vertical SCR for ESD protection in 40 V HV bipolar process

Fan Liu, Zhiwei Liu, Jizhi Liu, Cheng Hui, Zhao Liu, Tian Rui, Shiyu Song, Juin J. Liou. A novel vertical SCR for ESD protection in 40 V HV bipolar process. Microelectronics Reliability, 78:307-310, 2017. [doi]

@article{LiuLLHLRSL17,
  title = {A novel vertical SCR for ESD protection in 40 V HV bipolar process},
  author = {Fan Liu and Zhiwei Liu and Jizhi Liu and Cheng Hui and Zhao Liu and Tian Rui and Shiyu Song and Juin J. Liou},
  year = {2017},
  doi = {10.1016/j.microrel.2017.09.018},
  url = {https://doi.org/10.1016/j.microrel.2017.09.018},
  researchr = {https://researchr.org/publication/LiuLLHLRSL17},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {78},
  pages = {307-310},
}