A real-time anchor-free defect detector with global and local feature enhancement for surface defect detection

Qing Liu 0004, Min Liu 0002, Q. M. Jonathan Wu, Weiming Shen 0001. A real-time anchor-free defect detector with global and local feature enhancement for surface defect detection. Expert Syst. Appl., 246:123199, 2024. [doi]

Authors

Qing Liu 0004

This author has not been identified. Look up 'Qing Liu 0004' in Google

Min Liu 0002

This author has not been identified. Look up 'Min Liu 0002' in Google

Q. M. Jonathan Wu

This author has not been identified. Look up 'Q. M. Jonathan Wu' in Google

Weiming Shen 0001

This author has not been identified. Look up 'Weiming Shen 0001' in Google