Statistical Bilateral Asymmetry Measurement in Brain Images

Xin Liu, R. Todd Ogden, Celina Imielinska, Andrew Laine, E. Sander Connolly Jr., Anthony L. D'Ambrosio. Statistical Bilateral Asymmetry Measurement in Brain Images. In 28th International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2006, New York City, NY, USA, August 30 - September 3, 2006, Main Volume. pages 1441-1445, IEEE, 2006. [doi]

Authors

Xin Liu

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R. Todd Ogden

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Celina Imielinska

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Andrew Laine

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E. Sander Connolly Jr.

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Anthony L. D'Ambrosio

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