Xiao Liu, Loon Ching Tang. A sequential constant-stress accelerated life testing scheme and its Bayesian inference. Quality and Reliability Eng. Int., 25(1):91-109, 2009. [doi]
@article{LiuT09:0,
title = {A sequential constant-stress accelerated life testing scheme and its Bayesian inference},
author = {Xiao Liu and Loon Ching Tang},
year = {2009},
doi = {10.1002/qre.958},
url = {http://dx.doi.org/10.1002/qre.958},
tags = {testing},
researchr = {https://researchr.org/publication/LiuT09%3A0},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {25},
number = {1},
pages = {91-109},
}