A Bayesian optimal design for accelerated degradation tests

Xiao Liu, Loon Ching Tang. A Bayesian optimal design for accelerated degradation tests. Quality and Reliability Eng. Int., 26(8):863-875, 2010. [doi]

@article{LiuT10-15,
  title = {A Bayesian optimal design for accelerated degradation tests},
  author = {Xiao Liu and Loon Ching Tang},
  year = {2010},
  doi = {10.1002/qre.1151},
  url = {http://dx.doi.org/10.1002/qre.1151},
  tags = {testing, design},
  researchr = {https://researchr.org/publication/LiuT10-15},
  cites = {0},
  citedby = {0},
  journal = {Quality and Reliability Eng. Int.},
  volume = {26},
  number = {8},
  pages = {863-875},
}