Zero-Bias Deep-Learning-Enabled Quickest Abnormal Event Detection in IoT

Yongxin Liu, Jian Wang 0061, Jianqiang Li 0001, Shuteng Niu, Lei Wu, Houbing Song. Zero-Bias Deep-Learning-Enabled Quickest Abnormal Event Detection in IoT. IEEE Internet of Things Journal, 9(13):11385-11395, 2022. [doi]

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