An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects

Tieqiao Liu, Ting Yu, Shuo Wang, Shuo Cai. An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects. IEEE Access, 8:204855-204862, 2020. [doi]

@article{LiuYWC20,
  title = {An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects},
  author = {Tieqiao Liu and Ting Yu and Shuo Wang and Shuo Cai},
  year = {2020},
  doi = {10.1109/ACCESS.2020.3037292},
  url = {https://doi.org/10.1109/ACCESS.2020.3037292},
  researchr = {https://researchr.org/publication/LiuYWC20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {8},
  pages = {204855-204862},
}