Reliable Fix Patterns Inferred from Static Checkers for Automated Program Repair

Kui Liu 0001, Jingtang Zhang, Li Li 0029, Anil Koyuncu, Dongsun Kim 0001, Chunpeng Ge, Zhe Liu, Jacques Klein, Tegawendé F. Bissyandé. Reliable Fix Patterns Inferred from Static Checkers for Automated Program Repair. ACM Transactions on Software Engineering Methodology, 32(4), July 2023. [doi]

Authors

Kui Liu 0001

This author has not been identified. Look up 'Kui Liu 0001' in Google

Jingtang Zhang

This author has not been identified. Look up 'Jingtang Zhang' in Google

Li Li 0029

This author has not been identified. Look up 'Li Li 0029' in Google

Anil Koyuncu

This author has not been identified. Look up 'Anil Koyuncu' in Google

Dongsun Kim 0001

This author has not been identified. Look up 'Dongsun Kim 0001' in Google

Chunpeng Ge

This author has not been identified. Look up 'Chunpeng Ge' in Google

Zhe Liu

This author has not been identified. Look up 'Zhe Liu' in Google

Jacques Klein

This author has not been identified. Look up 'Jacques Klein' in Google

Tegawendé F. Bissyandé

This author has not been identified. Look up 'Tegawendé F. Bissyandé' in Google