Precise Measurement Methodology of nH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices

Jiapeng Liu, Biao Zhao, Wenpeng Zhou, Gang Lyu, Zhengyu Chen, Chaoqun Xu, Zhanqing Yu, Rong Zeng. Precise Measurement Methodology of nH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices. IEEE Transactions on Industrial Electronics, 68(8):6818-6827, 2021. [doi]

@article{LiuZZLCXYZ21,
  title = {Precise Measurement Methodology of nH-Level Gate Electrode Inductance Based on Calculation-Error-Free Algorithm for Unity-Gain Turn-Off Devices},
  author = {Jiapeng Liu and Biao Zhao and Wenpeng Zhou and Gang Lyu and Zhengyu Chen and Chaoqun Xu and Zhanqing Yu and Rong Zeng},
  year = {2021},
  doi = {10.1109/TIE.2020.3007089},
  url = {https://doi.org/10.1109/TIE.2020.3007089},
  researchr = {https://researchr.org/publication/LiuZZLCXYZ21},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {68},
  number = {8},
  pages = {6818-6827},
}