A Case Study of Self-Checking Circuits Reliability - researchr publication bibtex

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Jien-Chung Lo. A Case Study of Self-Checking Circuits Reliability. VLSI Design, 1998(4):373-383, 1998. [doi]

@article{Lo98-1,
  title = {A Case Study of Self-Checking Circuits Reliability},
  author = {Jien-Chung Lo},
  year = {1998},
  doi = {10.1155/1998/71348},
  url = {https://doi.org/10.1155/1998/71348},
  researchr = {https://researchr.org/publication/Lo98-1},
  cites = {0},
  citedby = {0},
  journal = {VLSI Design},
  volume = {1998},
  number = {4},
  pages = {373-383},
}

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