Huai-Wei Lo, James J. H. Liou, Chun-Nen Huang, Yen-Ching Chuang. A novel failure mode and effect analysis model for machine tool risk analysis. Rel. Eng. & Sys. Safety, 183:173-183, 2019. [doi]
@article{LoLHC19,
title = {A novel failure mode and effect analysis model for machine tool risk analysis},
author = {Huai-Wei Lo and James J. H. Liou and Chun-Nen Huang and Yen-Ching Chuang},
year = {2019},
doi = {10.1016/j.ress.2018.11.018},
url = {https://doi.org/10.1016/j.ress.2018.11.018},
researchr = {https://researchr.org/publication/LoLHC19},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {183},
pages = {173-183},
}