Yiwen Long, Mengyan Xiao, Xiaoqiang Wang, Bin Wang, Jun Luo, Shuo Diao. Ultrasonic scanning image defect detection of plastic packaging components based on FCOS. In ICDLT 2022: 6th International Conference on Deep Learning Technologies, Xi'an, China, July 26 - 28, 2022. pages 68-74, ACM, 2022. [doi]
@inproceedings{LongXWWLD22,
title = {Ultrasonic scanning image defect detection of plastic packaging components based on FCOS},
author = {Yiwen Long and Mengyan Xiao and Xiaoqiang Wang and Bin Wang and Jun Luo and Shuo Diao},
year = {2022},
doi = {10.1145/3556677.3556686},
url = {https://doi.org/10.1145/3556677.3556686},
researchr = {https://researchr.org/publication/LongXWWLD22},
cites = {0},
citedby = {0},
pages = {68-74},
booktitle = {ICDLT 2022: 6th International Conference on Deep Learning Technologies, Xi'an, China, July 26 - 28, 2022},
publisher = {ACM},
isbn = {978-1-4503-9693-6},
}