Dominik Lorenz, Martin Barke, Ulf Schlichtmann. Efficiently analyzing the impact of aging effects on large integrated circuits. Microelectronics Reliability, 52(8):1546-1552, 2012. [doi]
@article{LorenzBS12,
title = {Efficiently analyzing the impact of aging effects on large integrated circuits},
author = {Dominik Lorenz and Martin Barke and Ulf Schlichtmann},
year = {2012},
doi = {10.1016/j.microrel.2011.12.029},
url = {http://dx.doi.org/10.1016/j.microrel.2011.12.029},
researchr = {https://researchr.org/publication/LorenzBS12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {8},
pages = {1546-1552},
}