C-Planarity Testing of Embedded Clustered Graphs with Bounded Dual Carving-Width

Giordano Da Lozzo, David Eppstein, Michael T. Goodrich, Siddharth Gupta 0002. C-Planarity Testing of Embedded Clustered Graphs with Bounded Dual Carving-Width. In Bart M. P. Jansen, Jan Arne Telle, editors, 14th International Symposium on Parameterized and Exact Computation, IPEC 2019, September 11-13, 2019, Munich, Germany. Volume 148 of LIPIcs, Schloss Dagstuhl - Leibniz-Zentrum für Informatik, 2019. [doi]

@inproceedings{LozzoEG019,
  title = {C-Planarity Testing of Embedded Clustered Graphs with Bounded Dual Carving-Width},
  author = {Giordano Da Lozzo and David Eppstein and Michael T. Goodrich and Siddharth Gupta 0002},
  year = {2019},
  doi = {10.4230/LIPIcs.IPEC.2019.9},
  url = {https://doi.org/10.4230/LIPIcs.IPEC.2019.9},
  researchr = {https://researchr.org/publication/LozzoEG019},
  cites = {0},
  citedby = {0},
  booktitle = {14th International Symposium on Parameterized and Exact Computation, IPEC 2019, September 11-13, 2019, Munich, Germany},
  editor = {Bart M. P. Jansen and Jan Arne Telle},
  volume = {148},
  series = {LIPIcs},
  publisher = {Schloss Dagstuhl - Leibniz-Zentrum für Informatik},
  isbn = {978-3-95977-129-0},
}