Guan-Ruei Lu, Ansuman Banerjee, Bhargab B. Bhattacharya, Tsung-Yi Ho, Hung-Ming Chen. Reliability Hardening Mechanisms in Cyber-Physical Digital-Microfluidic Biochips. JETC, 14(3), 2018. [doi]
@article{LuBBHC18,
title = {Reliability Hardening Mechanisms in Cyber-Physical Digital-Microfluidic Biochips},
author = {Guan-Ruei Lu and Ansuman Banerjee and Bhargab B. Bhattacharya and Tsung-Yi Ho and Hung-Ming Chen},
year = {2018},
doi = {10.1145/3229052},
url = {https://doi.org/10.1145/3229052},
researchr = {https://researchr.org/publication/LuBBHC18},
cites = {0},
citedby = {0},
journal = {JETC},
volume = {14},
number = {3},
}