A 47 TOPS/W 10T SRAM-Based Multi-Bit Signed CIM With Self-Adaptive Bias Voltage Generator for Edge Computing Applications

Lu Lu, Anh-Tuan Do. A 47 TOPS/W 10T SRAM-Based Multi-Bit Signed CIM With Self-Adaptive Bias Voltage Generator for Edge Computing Applications. IEEE Trans. Circuits Syst. II Express Briefs, 70(9):3599-3603, September 2023. [doi]

@article{LuD23-4,
  title = {A 47 TOPS/W 10T SRAM-Based Multi-Bit Signed CIM With Self-Adaptive Bias Voltage Generator for Edge Computing Applications},
  author = {Lu Lu and Anh-Tuan Do},
  year = {2023},
  month = {September},
  doi = {10.1109/TCSII.2023.3274703},
  url = {https://doi.org/10.1109/TCSII.2023.3274703},
  researchr = {https://researchr.org/publication/LuD23-4},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Circuits Syst. II Express Briefs},
  volume = {70},
  number = {9},
  pages = {3599-3603},
}