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Data-driven testing methodology for RFID systems

An Lu, Wenbin Fang, Chang Xu, Shing-Chi Cheung, Yu Liu. Data-driven testing methodology for RFID systems. Frontiers of Computer Science in China, 4(3):354-364, 2010. [doi]

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An Lu

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Wenbin Fang

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Chang Xu

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Shing-Chi Cheung

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Yu Liu

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