Jiwen Lu, Junlin Hu, Yap-Peng Tan. Discriminative Deep Metric Learning for Face and Kinship Verification. IEEE Transactions on Image Processing, 26(9):4269-4282, 2017. [doi]
@article{LuHT17,
title = {Discriminative Deep Metric Learning for Face and Kinship Verification},
author = {Jiwen Lu and Junlin Hu and Yap-Peng Tan},
year = {2017},
doi = {10.1109/TIP.2017.2717505},
url = {https://doi.org/10.1109/TIP.2017.2717505},
researchr = {https://researchr.org/publication/LuHT17},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Image Processing},
volume = {26},
number = {9},
pages = {4269-4282},
}