Simeng Lu, Shen Huang, Yun Zhang, Xiujuan Zheng, Danmin Miao, Jiajun Wang, Zheru Chi. Detection of High-Risk Depression Groups Based on Eye-Tracking Data. In Yuxin Peng, Qingshan Liu 0001, Huchuan Lu 0001, Zhenan Sun, Chenglin Liu, Xilin Chen, Hongbin Zha, Jian Yang 0003, editors, Pattern Recognition and Computer Vision - Third Chinese Conference, PRCV 2020, Nanjing, China, October 16-18, 2020, Proceedings, Part II. Volume 12306 of Lecture Notes in Computer Science, pages 492-503, Springer, 2020. [doi]
@inproceedings{LuHZZMWC20,
title = {Detection of High-Risk Depression Groups Based on Eye-Tracking Data},
author = {Simeng Lu and Shen Huang and Yun Zhang and Xiujuan Zheng and Danmin Miao and Jiajun Wang and Zheru Chi},
year = {2020},
doi = {10.1007/978-3-030-60639-8_41},
url = {https://doi.org/10.1007/978-3-030-60639-8_41},
researchr = {https://researchr.org/publication/LuHZZMWC20},
cites = {0},
citedby = {0},
pages = {492-503},
booktitle = {Pattern Recognition and Computer Vision - Third Chinese Conference, PRCV 2020, Nanjing, China, October 16-18, 2020, Proceedings, Part II},
editor = {Yuxin Peng and Qingshan Liu 0001 and Huchuan Lu 0001 and Zhenan Sun and Chenglin Liu and Xilin Chen and Hongbin Zha and Jian Yang 0003},
volume = {12306},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-60639-8},
}