Jing Lu, Bin Luo. Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process. IEEE Access, 8:10686-10692, 2020. [doi]
@article{LuL20-1,
title = {Reliability Analysis of Vertical Cavity Surface-Emitting Lasers Based on the Gamma Process},
author = {Jing Lu and Bin Luo},
year = {2020},
doi = {10.1109/ACCESS.2020.2965625},
url = {https://doi.org/10.1109/ACCESS.2020.2965625},
researchr = {https://researchr.org/publication/LuL20-1},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {10686-10692},
}