Hongyi Lu, Yechang Wu, Shuqing Li, You Lin, Chaozu Zhang, Fengwei Zhang. BADUSB-C: Revisiting BadUSB with Type-C. In IEEE Security and Privacy Workshops, SP Workshops 2021, San Francisco, CA, USA, May 27, 2021. pages 327-338, IEEE, 2021. [doi]
@inproceedings{LuWLLZZ21,
title = {BADUSB-C: Revisiting BadUSB with Type-C},
author = {Hongyi Lu and Yechang Wu and Shuqing Li and You Lin and Chaozu Zhang and Fengwei Zhang},
year = {2021},
doi = {10.1109/SPW53761.2021.00053},
url = {https://doi.org/10.1109/SPW53761.2021.00053},
researchr = {https://researchr.org/publication/LuWLLZZ21},
cites = {0},
citedby = {0},
pages = {327-338},
booktitle = {IEEE Security and Privacy Workshops, SP Workshops 2021, San Francisco, CA, USA, May 27, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3732-5},
}