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Sensitivity and uniformity in statistical randomness tests

Elena Almaraz Luengo, Marcos Brian Leiva Cerna, Luis Javier García-Villalba, Darren Hurley-Smith, Julio César Hernández Castro. Sensitivity and uniformity in statistical randomness tests. Inf. Sec. Techn. Report, 70:103322, 2022. [doi]

Authors

Elena Almaraz Luengo

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Marcos Brian Leiva Cerna

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Luis Javier García-Villalba

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Darren Hurley-Smith

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Julio César Hernández Castro

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