Andreas Lugmayr, Martin Danelljan, Radu Timofte, Namhyuk Ahn, Dongwoon Bai, Jie Cai, Yun Cao, Junyang Chen, Kaihua Cheng, Se Young Chun, Wei Deng, Mostafa El-Khamy, Chiu Man Ho, Xiaozhong Ji, Amin Kheradmand, Gwantae Kim, Hanseok Ko, Kanghyu Lee, Jungwon Lee, Hao Li, Ziluan Liu, Zhi-Song Liu, Shuai Liu, Yunhua Lu, Zibo Meng, Pablo Navarrete Michelini, Christian Micheloni, Kalpesh Prajapati, Haoyu Ren, Yonghyeok Seo, Wan-Chi Siu, Kyung-Ah Sohn, Ying Tai, Rao Muhammad Umer, Shuangquan Wang, Huibing Wang, Timothy Haoning Wu, Haoning Wu, Biao Yang, Fuzhi Yang, Jaejun Yoo, Tongtong Zhao, Yuanbo Zhou, Haijie Zhuo, Ziyao Zong, Xueyi Zou. NTIRE 2020 Challenge on Real-World Image Super-Resolution: Methods and Results. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 2058-2076, IEEE, 2020. [doi]
@inproceedings{LugmayrDTABCCCC20,
title = {NTIRE 2020 Challenge on Real-World Image Super-Resolution: Methods and Results},
author = {Andreas Lugmayr and Martin Danelljan and Radu Timofte and Namhyuk Ahn and Dongwoon Bai and Jie Cai and Yun Cao and Junyang Chen and Kaihua Cheng and Se Young Chun and Wei Deng and Mostafa El-Khamy and Chiu Man Ho and Xiaozhong Ji and Amin Kheradmand and Gwantae Kim and Hanseok Ko and Kanghyu Lee and Jungwon Lee and Hao Li and Ziluan Liu and Zhi-Song Liu and Shuai Liu and Yunhua Lu and Zibo Meng and Pablo Navarrete Michelini and Christian Micheloni and Kalpesh Prajapati and Haoyu Ren and Yonghyeok Seo and Wan-Chi Siu and Kyung-Ah Sohn and Ying Tai and Rao Muhammad Umer and Shuangquan Wang and Huibing Wang and Timothy Haoning Wu and Haoning Wu and Biao Yang and Fuzhi Yang and Jaejun Yoo and Tongtong Zhao and Yuanbo Zhou and Haijie Zhuo and Ziyao Zong and Xueyi Zou},
year = {2020},
doi = {10.1109/CVPRW50498.2020.00255},
url = {https://doi.org/10.1109/CVPRW50498.2020.00255},
researchr = {https://researchr.org/publication/LugmayrDTABCCCC20},
cites = {0},
citedby = {0},
pages = {2058-2076},
booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9360-1},
}