Yixin Luo, Yu Cai, Saugata Ghose, Jongmoo Choi, Onur Mutlu. WARM: Improving NAND flash memory lifetime with write-hotness aware retention management. In IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015. pages 1-14, IEEE, 2015. [doi]
@inproceedings{LuoCGCM15,
title = {WARM: Improving NAND flash memory lifetime with write-hotness aware retention management},
author = {Yixin Luo and Yu Cai and Saugata Ghose and Jongmoo Choi and Onur Mutlu},
year = {2015},
doi = {10.1109/MSST.2015.7208284},
url = {http://dx.doi.org/10.1109/MSST.2015.7208284},
researchr = {https://researchr.org/publication/LuoCGCM15},
cites = {0},
citedby = {0},
pages = {1-14},
booktitle = {IEEE 31st Symposium on Mass Storage Systems and Technologies, MSST 2015, Santa Clara, CA, USA, May 30 - June 5, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7619-8},
}