Qingli Luo, Zhiyuan Chen, Shubin Zhang. Image-based Rail Surface Defect Detection of Line-Structured Light Data. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2023, Kuala Lumpur, Malaysia, May 22-25, 2023. pages 1-5, IEEE, 2023. [doi]
@inproceedings{LuoCZ23, title = {Image-based Rail Surface Defect Detection of Line-Structured Light Data}, author = {Qingli Luo and Zhiyuan Chen and Shubin Zhang}, year = {2023}, doi = {10.1109/I2MTC53148.2023.10176063}, url = {https://doi.org/10.1109/I2MTC53148.2023.10176063}, researchr = {https://researchr.org/publication/LuoCZ23}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2023, Kuala Lumpur, Malaysia, May 22-25, 2023}, publisher = {IEEE}, isbn = {978-1-6654-5383-7}, }