Hao Luo, Mehrdad Heydarzadeh, Mehrdad Nourani. Aging-Leakage Tradeoffs Using Multi-Vth Cell Library. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 298-303, IEEE Computer Society, 2016. [doi]
@inproceedings{LuoHN16,
title = {Aging-Leakage Tradeoffs Using Multi-Vth Cell Library},
author = {Hao Luo and Mehrdad Heydarzadeh and Mehrdad Nourani},
year = {2016},
doi = {10.1109/ATS.2016.13},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.13},
researchr = {https://researchr.org/publication/LuoHN16},
cites = {0},
citedby = {0},
pages = {298-303},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}