Wenjun Luo, Huan Wang 0015. Composite Wafer Defect Recognition Framework Based on Multiview Dynamic Feature Enhancement With Class-Specific Classifier. IEEE T. Instrumentation and Measurement, 72:1-12, 2023. [doi]
@article{LuoW23-0,
title = {Composite Wafer Defect Recognition Framework Based on Multiview Dynamic Feature Enhancement With Class-Specific Classifier},
author = {Wenjun Luo and Huan Wang 0015},
year = {2023},
doi = {10.1109/TIM.2023.3261924},
url = {https://doi.org/10.1109/TIM.2023.3261924},
researchr = {https://researchr.org/publication/LuoW23-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {72},
pages = {1-12},
}