Wei Luo, Chun-Hua Zhang, Xun Chen, Yuan-yuan Tan. Accelerated reliability demonstration under competing failure modes. Rel. Eng. & Sys. Safety, 136:75-84, 2015. [doi]
@article{LuoZCT15, title = {Accelerated reliability demonstration under competing failure modes}, author = {Wei Luo and Chun-Hua Zhang and Xun Chen and Yuan-yuan Tan}, year = {2015}, doi = {10.1016/j.ress.2014.11.014}, url = {http://dx.doi.org/10.1016/j.ress.2014.11.014}, researchr = {https://researchr.org/publication/LuoZCT15}, cites = {0}, citedby = {0}, journal = {Rel. Eng. & Sys. Safety}, volume = {136}, pages = {75-84}, }