Wei Luo, Chun-Hua Zhang, Xun Chen, Yuan-yuan Tan. Accelerated reliability demonstration under competing failure modes. Rel. Eng. & Sys. Safety, 136:75-84, 2015. [doi]
@article{LuoZCT15,
title = {Accelerated reliability demonstration under competing failure modes},
author = {Wei Luo and Chun-Hua Zhang and Xun Chen and Yuan-yuan Tan},
year = {2015},
doi = {10.1016/j.ress.2014.11.014},
url = {http://dx.doi.org/10.1016/j.ress.2014.11.014},
researchr = {https://researchr.org/publication/LuoZCT15},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {136},
pages = {75-84},
}