An integrated rad-hard test-vehicle for embedded emerging memories - researchr publication authors

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Nicola Lupo, Cristiano Calligaro, Christian Wenger, Franco Maloberti. An integrated rad-hard test-vehicle for embedded emerging memories. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 5-8, IEEE, 2016. [doi]

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