Automated Nanoparticle Count via Modified BlendMask Instance Segmentation on SEM Images

Linpeng Lv, Futong He, Jiahui Zhang, Liling Mao, Jingchuan Fan, Guoqiang Xiao, Xiaoqin Tang. Automated Nanoparticle Count via Modified BlendMask Instance Segmentation on SEM Images. In Yufei Huang, Lukasz A. Kurgan, Feng Luo, Xiaohua Hu, Yidong Chen, Edward R. Dougherty, Andrzej Kloczkowski, Yaohang Li, editors, IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2021, Houston, TX, USA, December 9-12, 2021. pages 1757-1764, IEEE, 2021. [doi]

@inproceedings{LvHZMFXT21,
  title = {Automated Nanoparticle Count via Modified BlendMask Instance Segmentation on SEM Images},
  author = {Linpeng Lv and Futong He and Jiahui Zhang and Liling Mao and Jingchuan Fan and Guoqiang Xiao and Xiaoqin Tang},
  year = {2021},
  doi = {10.1109/BIBM52615.2021.9669432},
  url = {https://doi.org/10.1109/BIBM52615.2021.9669432},
  researchr = {https://researchr.org/publication/LvHZMFXT21},
  cites = {0},
  citedby = {0},
  pages = {1757-1764},
  booktitle = {IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2021, Houston, TX, USA, December 9-12, 2021},
  editor = {Yufei Huang and Lukasz A. Kurgan and Feng Luo and Xiaohua Hu and Yidong Chen and Edward R. Dougherty and Andrzej Kloczkowski and Yaohang Li},
  publisher = {IEEE},
  isbn = {978-1-6654-0126-5},
}