Sparse Bayesian Learning-Based Topology Reconstruction Under Measurement Perturbation for Fault Location

Xiaodong Lv, Lifen Yuan, Zhen Cheng, Yigang He, Baiqiang Yin, Chengwei Ding. Sparse Bayesian Learning-Based Topology Reconstruction Under Measurement Perturbation for Fault Location. IEEE T. Instrumentation and Measurement, 73:1-9, 2024. [doi]

@article{LvYCHYD24,
  title = {Sparse Bayesian Learning-Based Topology Reconstruction Under Measurement Perturbation for Fault Location},
  author = {Xiaodong Lv and Lifen Yuan and Zhen Cheng and Yigang He and Baiqiang Yin and Chengwei Ding},
  year = {2024},
  doi = {10.1109/TIM.2023.3332942},
  url = {https://doi.org/10.1109/TIM.2023.3332942},
  researchr = {https://researchr.org/publication/LvYCHYD24},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {73},
  pages = {1-9},
}