T. P. Ma. Novel electrical characterization for advanced CMOS gate dielectrics. Science in China Series F: Information Sciences, 51(6):774-779, 2008. [doi]
@article{Ma08:6,
title = {Novel electrical characterization for advanced CMOS gate dielectrics},
author = {T. P. Ma},
year = {2008},
doi = {10.1007/s11432-008-0068-3},
url = {http://dx.doi.org/10.1007/s11432-008-0068-3},
researchr = {https://researchr.org/publication/Ma08%3A6},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {51},
number = {6},
pages = {774-779},
}