Jianwei Ma. Compressed Sensing for Surface Characterization and Metrology. IEEE T. Instrumentation and Measurement, 59(6):1600-1615, 2010. [doi]
@article{Ma10-14,
title = {Compressed Sensing for Surface Characterization and Metrology},
author = {Jianwei Ma},
year = {2010},
doi = {10.1109/TIM.2009.2027744},
url = {http://dx.doi.org/10.1109/TIM.2009.2027744},
researchr = {https://researchr.org/publication/Ma10-14},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {59},
number = {6},
pages = {1600-1615},
}