Haoran Ma, Anil Kunwar, Jun Chen, Lin Qu, Yunpeng Wang, Xueguan Song, Peter Råback, Haitao Ma, Ning Zhao. Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy. Microelectronics Reliability, 83:198-205, 2018. [doi]
@article{MaKCQWSRMZ18,
title = {Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy},
author = {Haoran Ma and Anil Kunwar and Jun Chen and Lin Qu and Yunpeng Wang and Xueguan Song and Peter Råback and Haitao Ma and Ning Zhao},
year = {2018},
doi = {10.1016/j.microrel.2018.02.013},
url = {https://doi.org/10.1016/j.microrel.2018.02.013},
researchr = {https://researchr.org/publication/MaKCQWSRMZ18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {83},
pages = {198-205},
}