Asymmetric issues of FinFET device after hot carrier injection and impact on digital and analog circuits - researchr publication authors

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Chenyue Ma, Hao Wang, Xiufang Zhang, Frank He, Yadong He, Xing Zhang, Xinnan Lin. Asymmetric issues of FinFET device after hot carrier injection and impact on digital and analog circuits. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 432-436, IEEE, 2010. [doi]

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