Chenyue Ma, Lining Zhang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang. A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection. Microelectronics Reliability, 51(2):337-341, 2011. [doi]
@article{MaZZZHZ11,
title = {A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection},
author = {Chenyue Ma and Lining Zhang and Chenfei Zhang and Xiufang Zhang and Jin He and Xing Zhang},
year = {2011},
doi = {10.1016/j.microrel.2010.08.023},
url = {http://dx.doi.org/10.1016/j.microrel.2010.08.023},
tags = {rule-based},
researchr = {https://researchr.org/publication/MaZZZHZ11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {2},
pages = {337-341},
}