Reliability study of Power RF LDMOS for Radar Application

Hichame Maanane, Pierre Bertram, Jérôme Marcon, Mohamed Masmoudi, M. A. Belaïd, Karine Mourgues, Philippe Eudeline, K. Ketata. Reliability study of Power RF LDMOS for Radar Application. Microelectronics Reliability, 44(9-11):1449-1454, 2004. [doi]

Authors

Hichame Maanane

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Pierre Bertram

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Jérôme Marcon

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Mohamed Masmoudi

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M. A. Belaïd

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Karine Mourgues

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Philippe Eudeline

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K. Ketata

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