Principled OOD Detection via Multiple Testing

Akshayaa Magesh, Venugopal V. Veeravalli, Anirban Roy, Susmit Jha. Principled OOD Detection via Multiple Testing. In IEEE International Symposium on Information Theory, ISIT 2023, Taipei, Taiwan, June 25-30, 2023. pages 1026-1031, IEEE, 2023. [doi]

Authors

Akshayaa Magesh

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Venugopal V. Veeravalli

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Anirban Roy

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Susmit Jha

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