Seyyed Javad Seyyed Mahdavi, Karim Mohammadi. Reliability enhancement of digital combinational circuits based on evolutionary approach. Microelectronics Reliability, 50(3):415-423, 2010. [doi]
@article{MahdaviM10,
title = {Reliability enhancement of digital combinational circuits based on evolutionary approach},
author = {Seyyed Javad Seyyed Mahdavi and Karim Mohammadi},
year = {2010},
doi = {10.1016/j.microrel.2009.11.016},
url = {http://dx.doi.org/10.1016/j.microrel.2009.11.016},
tags = {rule-based, reliability, systematic-approach},
researchr = {https://researchr.org/publication/MahdaviM10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {3},
pages = {415-423},
}