Improved single-pass approach for reliability analysis of digital combinational circuits

Seyyed Javad Seyyed Mahdavi, Karim Mohammadi. Improved single-pass approach for reliability analysis of digital combinational circuits. Microelectronics Reliability, 51(2):477-484, 2011. [doi]

Authors

Seyyed Javad Seyyed Mahdavi

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Karim Mohammadi

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