Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits - researchr publication authors

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Keiko Makie-Fukuda, Takanobu Anbo, Toshiro Tsukada. Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits. IEEE T. Instrumentation and Measurement, 48(6):1068-1072, 1999. [doi]

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