An Empirical Comparison of Machine Learning Techniques for Software Defect Prediction

Ruchika Malhotra, Rajeev R. Raje. An Empirical Comparison of Machine Learning Techniques for Software Defect Prediction. In Junichi Suzuki, Tadashi Nakano, editors, 8th International Conference on Bio-inspired Information and Communications Technologies, BICT 2014, Boston, MA, USA, December 1-3, 2014. ICST, 2014. [doi]

Authors

Ruchika Malhotra

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Rajeev R. Raje

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