Wojciech Maly, Samir B. Naik. Process Monitoring Oriented IC Testing. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 527-532, IEEE Computer Society, 1989.
@inproceedings{MalyN89,
title = {Process Monitoring Oriented IC Testing},
author = {Wojciech Maly and Samir B. Naik},
year = {1989},
tags = {process monitoring, testing},
researchr = {https://researchr.org/publication/MalyN89},
cites = {0},
citedby = {0},
pages = {527-532},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989},
publisher = {IEEE Computer Society},
}