Workload-driven selective hardening of control state elements in modern microprocessors

Michail Maniatakos, Yiorgos Makris. Workload-driven selective hardening of control state elements in modern microprocessors. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 159-164, IEEE Computer Society, 2010. [doi]

@inproceedings{ManiatakosM10,
  title = {Workload-driven selective hardening of control state elements in modern microprocessors},
  author = {Michail Maniatakos and Yiorgos Makris},
  year = {2010},
  doi = {10.1109/VTS.2010.5469589},
  url = {http://dx.doi.org/10.1109/VTS.2010.5469589},
  researchr = {https://researchr.org/publication/ManiatakosM10},
  cites = {0},
  citedby = {0},
  pages = {159-164},
  booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4244-6648-1},
}