V. Mao, V. Thusu, Chris Dwyer, Krishnendu Chakrabarty. Connecting fabrication defects to fault models and SPICE simulations for DNA self-assembled nanoelectronics. IET Computers & Digital Techniques, 3(6):553-569, 2009. [doi]
@article{MaoTDC09,
title = {Connecting fabrication defects to fault models and SPICE simulations for DNA self-assembled nanoelectronics},
author = {V. Mao and V. Thusu and Chris Dwyer and Krishnendu Chakrabarty},
year = {2009},
doi = {10.1049/iet-cdt.2008.0136},
url = {http://dx.doi.org/10.1049/iet-cdt.2008.0136},
researchr = {https://researchr.org/publication/MaoTDC09},
cites = {0},
citedby = {0},
journal = {IET Computers & Digital Techniques},
volume = {3},
number = {6},
pages = {553-569},
}