Erik Jan Marinissen. An Industrial Approach to Core-Based System Chip Testing. In Michel Robert, Bruno Rouzeyre, Christian Piguet, Marie-Lise Flottes, editors, SOC Design Methodologies, IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on/Chip (VLSI-SOC 01), December 3-5, 2001, Montpellier, France. Volume 218 of IFIP Conference Proceedings, pages 389-400, Kluwer, 2001.
@inproceedings{Marinissen01,
title = {An Industrial Approach to Core-Based System Chip Testing},
author = {Erik Jan Marinissen},
year = {2001},
tags = {rule-based, testing, systematic-approach},
researchr = {https://researchr.org/publication/Marinissen01},
cites = {0},
citedby = {0},
pages = {389-400},
booktitle = {SOC Design Methodologies, IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on/Chip (VLSI-SOC 01), December 3-5, 2001, Montpellier, France},
editor = {Michel Robert and Bruno Rouzeyre and Christian Piguet and Marie-Lise Flottes},
volume = {218},
series = {IFIP Conference Proceedings},
publisher = {Kluwer},
isbn = {1-4020-7148-5},
}