RTS noise impact in CMOS image sensors readout circuit - researchr publication authors

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Philippe Martin-Gonthier, Pierre Magnan. RTS noise impact in CMOS image sensors readout circuit. In 16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009, Yasmine Hammamet, Tunesia, 13-19 December, 2009. pages 928-931, IEEE, 2009. [doi]

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